Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits (Pap

Hybrid Code-Based Test Data Compression and Decompression for VLSI Circuits (Pap

USD 75.49 USD
SKU: dVjjVhFG
Brand: Grin Verlag
GTIN: 3668737509
Condition: Brand New
Categories: Books & Magazines

Specifications

EAN9783668737501
ISBN3668737509
ManufacturerGrin Verlag
BrandGrin Verlag
PublisherGrin Verlag
FormatPaperback or Softback
LanguageENG
Item Weight0.64
Item Length8.27
Item Width5.83
Item Height0.5

This activity book has a treasure hunt activity that spans several pages.

Related Items